مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

3793173

Title :

Guest Editorial

Volume :

Issue :

fYear :

2006

Firstpage :

3161

Lastpage :

3162

Keywords :

"Distortion measurement","Phase measurement","Time domain analysis","Frequency measurement","Instruments","Microwave measurements","Current measurement","Calibration","Nonlinear distortion","Microwave circuits"

Journal_Title :

IEEE Transactions on Microwave Theory and Techniques

Publisher :

ieee

ISSN :

0018-9480

Type :

jour

DOI :

10.1109/TMTT.2006.879178

Filename :

1668331

Link To Document :

https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3793173