DocumentCode :
3793511
Title :
Introduction to the Special Issue on the 2005 International Integrated Reliability Workshop
Author :
J.F. Conley;Y. Chen;B. Knowlton;T. Sullivan;B. Tonti
Volume :
6
Issue :
2
fYear :
2006
Firstpage :
115
Lastpage :
116
Keywords :
"Special issues and sections","Materials reliability","Conferences","Semiconductor device reliability","Threshold voltage","Lakes","MOSFET circuits","Bonding","Hafnium oxide","Electrons"
Journal_Title :
IEEE Transactions on Device and Materials Reliability
Publisher :
ieee
ISSN :
1530-4388
Type :
jour
DOI :
10.1109/TDMR.2006.877374
Filename :
1673697
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3793511
