Analog IP testing: diagnosis and optimization

Author

Guardiani, Carlo ; McNamara, Patrick ; Daldoss, Lidia ; Zanella, Stefano ; Saxena, Sharad ; Liu, Suli ; Xiang, Wei

Author_Institution

PDF Solutions Inc., San Jose, CA, USA

fYear

2002

fDate

2002

Firstpage

192

Lastpage

196

Abstract

In this paper we present an innovative methodology to estimate and improve the quality of analog and mixed-signal circuit testing. We first detect and reduce the redundancy in the electrical test measurements (e-tests), then we identify the e-test acceptability regions by considering performance specifications as well as process parameter distributions. Finally, we provide an effective metric for the accurate assessment of the parametric test coverage of embedded analog IP. Experimental results confirm the validity of the proposed methodology and its broad applicability to analog, mixed-signal and RF applications for different process technologies

Keywords

SPICE; analogue integrated circuits; integrated circuit testing; mixed analogue-digital integrated circuits; redundancy; statistical analysis; surface fitting; RF applications; analog IP testing; analog circuit testing; electrical test measurements; embedded analog IP; mixed-signal circuit testing; optimization; parametric test coverage metric; performance specifications; process parameter distributions; redundancy; response surface methodology; statistical SPICE models; Automatic testing; Circuit faults; Circuit testing; Controllability; Electric variables measurement; Logic testing; Observability; Principal component analysis; Radio frequency; Redundancy;

fLanguage

English

Publisher

ieee

Conference_Titel

Design, Automation and Test in Europe Conference and Exhibition, 2002. Proceedings

Conference_Location

Paris

ISSN

1530-1591

Print_ISBN

0-7695-1471-5

Type

conf

DOI

10.1109/DATE.2002.998269

Filename

998269