DocumentCode
379756
Title
Passive constrained rational approximation algorithm using Nevanlinna-Pick interpolation
Author
Coelho, Carlos P. ; Phillips, Joel R. ; Silveira, L. Miguel
Author_Institution
Dept. of Electr. & Comput. Eng., Tech. Univ. Lisbon, Portugal
fYear
2002
fDate
2002
Firstpage
923
Lastpage
930
Abstract
As system integration evolves and tighter design constraints must be met, it becomes necessary to account for the non-ideal behavior of all the elements in a system. For high-speed digital, and microwave systems, it is increasingly important to model previously neglected frequency domain effects. In this paper, results from Nevanlinna-Pick interpolation theory are used to develop a bounded real matrix rational approximation algorithm. A method is presented that allows for the generation of guaranteed passive rational function models of passive systems by approximating their scattering parameter matrices. Since the order of the models may in some cases be high, an incremental fitting strategy is also proposed that allows for the generation of smaller models while still meeting the required passivity and accuracy requirements. Results of the application of the proposed method to several real-world examples are also shown
Keywords
S-parameters; frequency response; frequency-domain analysis; high-speed integrated circuits; interpolation; multiport networks; passive networks; rational functions; Nevanlinna-Pick interpolation theory; accuracy; bounded real matrix; design constraints; frequency domain effects; high-speed digital systems; incremental fitting strategy; microwave systems; nonideal behavior; passive constrained rational approximation algorithm; passivity; rational approximation algorithm; scattering parameter matrices; Admittance; Approximation algorithms; Circuit simulation; Frequency domain analysis; Frequency response; Interpolation; Laboratories; Scattering parameters; Time domain analysis; Transmission line matrix methods;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation and Test in Europe Conference and Exhibition, 2002. Proceedings
Conference_Location
Paris
ISSN
1530-1591
Print_ISBN
0-7695-1471-5
Type
conf
DOI
10.1109/DATE.2002.998410
Filename
998410
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