DocumentCode :
3798527
Title :
Built-In Self-Test: Pass or Fail?
Volume :
2
Issue :
2
fYear :
1985
Firstpage :
17
Lastpage :
19
Keywords :
"Built-in self-test","Programmable logic arrays","Circuit testing","Costs","Circuit faults","Life testing","Logic testing","AC generators","Process design","Design automation"
Journal_Title :
IEEE Design & Test of Computers
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.1985.294854
Filename :
4069536
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3798527
