• DocumentCode
    3798529
  • Title

    Fault Modeling

  • Volume
    2
  • Issue
    2
  • fYear
    1985
  • Firstpage
    88
  • Lastpage
    95
  • Keywords
    "Tutorials","Semiconductor device modeling","Circuit testing","CMOS technology","MOSFETs","Integrated circuit interconnections","Substrates","Computer aided manufacturing","Digital systems","Logic testing"
  • Journal_Title
    IEEE Design & Test of Computers
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.1985.294873
  • Filename
    4069555
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3798529