Title :
Surface impedance of thin high temperature superconducting films with a sapphire dielectric resonator
Author :
Krupka, J. ; Derzakowski, K. ; Abramowicz, A. ; Baker-Jarvis, J. ; Ono, R. ; Geyer, R.
Author_Institution :
Inst. of Microelectron. & Optoelectron., Warsaw, Poland
Abstract :
The dielectric resonator technique is frequently used for surface resistance measurements of superconducting films. Generally, an effective surface resistance has been measured which neglects the finite thickness of superconducting films. The thickness dependence of the surface impedance of superconducting films, whose thickness is comparable to the London penetration depth, is presented.
Keywords :
Q-factor; dielectric resonators; electric resistance measurement; high-temperature superconductors; microwave measurement; penetration depth (superconductivity); sapphire; superconducting thin films; surface resistance; Al2O3; London penetration depth thickness; Q-factor; dielectric resonator surface resistance measurement techniques; effective surface resistance; high-temperature superconducting thin films; resonant frequency; sapphire dielectric resonators; superconducting film finite thickness; surface impedance measurements; surface impedance thickness dependence; Dielectric measurements; Electrical resistance measurement; Frequency measurement; Impedance measurement; Q factor; Resonant frequency; Superconducting films; Surface impedance; Surface resistance; Temperature;
Conference_Titel :
Microwaves, Radar and Wireless Communications, 2002. MIKON-2002. 14th International Conference on
Print_ISBN :
83-906662-5-1
DOI :
10.1109/MIKON.2002.1017873
