Title :
Fault Diagnosis of Digital Systems
Author :
H. Y. Chang;E. G. Manning;G. Metze;Stephen Y. H. Su
Author_Institution :
Department of Computing and Information Sciences, Case Western Reserve University, Cleveland, Ohio 44106
Keywords :
"Fault diagnosis","Digital systems","Books","Circuit testing","Circuit faults","Sequential analysis","Logic testing","Computational modeling","Power system transients","Availability"
Journal_Title :
IEEE Transactions on Systems, Man, and Cybernetics
DOI :
10.1109/TSMC.1973.4309229
