Title :
Parameterschätzverfahren zur Systemidentifikation
Author :
H. Unbehauen;B. Gohring;B. Bauer;Thomas J. Higgins
Author_Institution :
Department of Electrical and Computer Engineering, University of Wisconsin, Madison, WI 53076
fDate :
4/1/1977 12:00:00 AM
Keywords :
"Pattern recognition","Books","Bibliographies","Terminology","Maintenance engineering","Reliability engineering","Statistics","Information theory","IEEE catalog"
Journal_Title :
IEEE Transactions on Systems, Man, and Cybernetics
DOI :
10.1109/TSMC.1977.4309710
