Adjustment of Demagnetizing Field in Permalloy Nanowires to Control Domain Wall Motion

Author

Kuei-Chang Hu ; Hong-Yo Lu ; Chia-Chi Chang ; Hao-Hsuan Chen ; Feng-Sheng Wu ; Chao-Hsien Huang ; Tian-Chiuan Wu ; Lin, Li-Chiun ; Jong-Ching Wu ; Horng, Lance

Author_Institution

Dept. of Phys., Nat. Changhua Univ. of Educ., Changhua, Taiwan

Volume

50

Issue

1

fYear

2014

fDate

Jan. 2014

Firstpage

1

Lastpage

3

Abstract

The domain wall motion in permalloy nanowires has been investigated widely due to its potential for a new type of memory. In this paper. we use the LLG Simulator based on the Landau-Lifshitz-Gilbert (LLG) equation to investigate the field-driven domain-wall motion in a long, straight ferromagnetic strip. An injection field of 60 Oe is applied to inject a domain wall from an extended disk into the nanowire. We found a dependence of nanowire dimensions with the velocity of domain wall. By increasing the width of the nanowire, the velocity of the domain wall motion also increases, while the Walker breakdown field ( HWB) decreases. On the other hand, increasing the thicknesses of the nanowire, the domain wall velocity, HWB, and demagnetizing field all decrease. By applying a vertical field from 0 to 1000 Oe in order to enhance the demagnetizing field, it is found the HWB is increased from 16 to 20 Oe.

Keywords

Permalloy; demagnetisation; electric breakdown; ferromagnetic materials; magnetic domain walls; nanomagnetics; nanowires; FeNi; LLG equation; LLG simulator; Landau-Lifshitz-Gilbert equation; Walker breakdown field; demagnetizing field; domain wall motion velocity; field-driven domain-wall motion; injection field; memory type materials; nanowire dimensions; nanowire thicknesses; permalloy nanowires; straight ferromagnetic strip; Demagnetization; Electric breakdown; Magnetic domain walls; Magnetic domains; Nanowires; Wires; Demagnetizing field; Landau-Lifshitz-Gilbert (LLG) simulation; domain wall motion; walker breakdown;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/TMAG.2013.2273571

Filename

6692919