DocumentCode :
3809832
Title :
Book review: Transmission Electron Microscopy of Silicon VLSI Circuits and Structures
Author :
H. Ahmed
Volume :
132
Issue :
1
fYear :
1985
fDate :
2/1/1985 12:00:00 AM
Firstpage :
46
Journal_Title :
IEE Proceedings I - Solid-State and Electron Devices
Publisher :
iet
ISSN :
0143-7100
Type :
jour
DOI :
10.1049/ip-i-1.1985.0011
Filename :
4643849
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3809832
