DocumentCode :
381786
Title :
Surface effect humidity sensor based on alumina and porous silicon materials: some electrical parameters, sensitivity and internal noises in comparison
Author :
An, Dao Khac ; Le Hoang, Mai
Author_Institution :
Dept. of R&D of Sensors, NCST, Hanoi, Vietnam
Volume :
1
fYear :
2002
fDate :
2002
Firstpage :
633
Abstract :
For comparison, two types of materials: porous alumina and porous silicon have been prepared by anodization method and used for fabrication of humidity sensors in the same size and sensor structure which operate on the base of conductivity versus relative humidity (RH%). The material structures of porous alumina and porous silicon were investigated by transmission electron microscope (TEM), atomic force microscope (AFM). The porous structures of two materials are shown. The conductance, capacitance and admittance vs. humidity and frequency of sensors have been also measured by impedance analysis spectroscopy. The relative permittivity of two porous materials has been determined. The internal noise sources as well as noise equivalent circuits of two kinds of sensors have been established and measured. The experimental results showed that conductance vs. humidity curve of porous silicon is better than that of alumina, especially the conductance magnitude of annealed porous silicon sensor is larger by 2 - 3 orders in comparison with that of the alumina sensor or nonannealed silicon sensor. The porous silicon sensor gives shorter response time, smaller hysteresis, more stability, longer life in comparison with that of alumina sensor. The differences of the properties of two kinds of sensors may be explained by different porous structures as well as conductive mechanisms.
Keywords :
alumina; anodisation; atomic force microscopy; electron device noise; elemental semiconductors; humidity sensors; porous materials; porous semiconductors; semiconductor device noise; sensitivity; silicon; transmission electron microscopy; AFM; Al2O3; Si; TEM; admittance; anodization method; capacitance; conductance; conductive mechanisms; electrical parameters; hysteresis; impedance analysis spectroscopy; internal noise; noise equivalent circuits; porous structures; relative permittivity; response time; sensitivity; surface effect humidity sensor; Atomic force microscopy; Atomic measurements; Circuit noise; Conducting materials; Conductivity; Fabrication; Humidity; Permittivity measurement; Silicon; Transmission electron microscopy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Sensors, 2002. Proceedings of IEEE
Print_ISBN :
0-7803-7454-1
Type :
conf
DOI :
10.1109/ICSENS.2002.1037175
Filename :
1037175
Link To Document :
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