Title :
Towards random field modeling of wavelet statistics
Author :
Azimifar, Z. ; Fieguth, P. ; Jernigan, E.
Author_Institution :
Dept. of Syst. Design Eng., Waterloo Univ., Ont., Canada
Abstract :
The paper investigates the statistical characterization of signals and images in the wavelet domain. In particular, in contrast to common decorrelated-coefficient models, we find that the correlation between wavelet scales can be surprisingly substantial, even across several scales. We investigate possible choices of statistical-interaction models. One efficient and fast strategy which describes the wavelet-based statistical correlations is illustrated. Finally, the effectiveness of the proposed tool towards an efficient hierarchical MRF (Markov random field) modeling of within-scale neighborhoods and across-scale dependencies is demonstrated.
Keywords :
Markov processes; image processing; statistical analysis; wavelet transforms; MRF; Markov random field modeling; image characterization; signal characterization; statistical image processing; wavelet statistics; Decorrelation; Design engineering; Hidden Markov models; Image recognition; Markov random fields; Statistical distributions; Statistics; Systems engineering and theory; Wavelet coefficients; Wavelet domain;
Conference_Titel :
Image Processing. 2002. Proceedings. 2002 International Conference on
Print_ISBN :
0-7803-7622-6
DOI :
10.1109/ICIP.2002.1038035