DocumentCode :
38228
Title :
A 600 µA 32 kHz Input 960 MHz Output CP-PLL With 530 ps Integrated Jitter in 28 nm FD-SOI Process
Author :
Lahiri, Abhirup ; Gupta, Nitin ; Kumar, Anand ; Dhadda, Pradeep
Author_Institution :
Technol. R&D Group, STMicroelectron., Crolles, France
Volume :
50
Issue :
7
fYear :
2015
fDate :
Jul-15
Firstpage :
1680
Lastpage :
1689
Abstract :
This paper presents a 32 kHz input and 960 MHz output low-power charge-pump phase-locked loop (CP-PLL) with a novel dual-path loop-filter for resistor noise reduction technique. The resistor noise reduction technique using dual-path loop-filter involves no “additional” active component; area/power overhead compared to the conventional CP-PLL. Reverse sub-threshold leakage compensated source-switched charge-pump (SS-CP) is employed in the PLL for improved reference spur performance. The PLL with minimum analog supply voltage of 1.62 V and minimum digital supply voltage of 0.65 V; with die area of 0.15 mm 2 is designed and fabricated in 28 nm STMicroelectronics FD-SOI process. The silicon measurement results have been included and the PLL performance includes total integrated jitter of 530 ps, reference spur of -65 dBc and current consumption of 600 μA.
Keywords :
charge pump circuits; circuit noise; elemental semiconductors; filters; jitter; phase locked loops; resistors; silicon; silicon-on-insulator; CP-PLL; Integrated Jitter; STMicroelectronics FD-SOI process; Si; current 600 muA; current consumption; dual-path loop-filter; frequency 32 kHz to 960 MHz; low-power charge-pump phase-locked loop; reference spur performance; resistor noise reduction technique; reverse sub-threshold leakage compensated source-switched charge-pump; silicon measurement; size 98 nm; voltage 1.62 V to 0.65 V; Capacitors; Charge pumps; Jitter; Noise; Phase locked loops; Resistors; Voltage-controlled oscillators; Charge-pump phase-locked loop (CP-PLL); jitter; loop filter; voltage-controlled oscillator (VCO);
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2015.2412680
Filename :
7091963
Link To Document :
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