• DocumentCode
    38272
  • Title

    Model-Based Prognosis for Hybrid Systems With Mode-Dependent Degradation Behaviors

  • Author

    Ming Yu ; Danwei Wang ; Ming Luo

  • Author_Institution
    Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, Singapore
  • Volume
    61
  • Issue
    1
  • fYear
    2014
  • fDate
    Jan. 2014
  • Firstpage
    546
  • Lastpage
    554
  • Abstract
    Prognosis of hybrid systems is a challenging problem because multiple faults may happen simultaneously at a mode where these faults have different detectability. In other words, at the fault-initiating mode, some of the faults are detectable while others are nondetectable. As a result, decision making based on only one observation of abnormal behavior is not reliable under this condition. This paper focuses on the development of a model-based prognosis framework for hybrid systems where a dynamic fault isolation scheme is proposed to facilitate the prognostic tasks. The degradation behavior of each faulty component is mode dependent and can be estimated by a hybrid differential evolution algorithm. Thereafter, the remaining useful life of the faulty component that varies with different operating modes is calculated by using both the estimated degradation model and the user-selected failure threshold. Experiments are carried out to validate the key concepts of the developed methods, and results suggest the effectiveness.
  • Keywords
    condition monitoring; evolutionary computation; failure analysis; fault diagnosis; remaining life assessment; decision making; degradation model estimation; dynamic fault isolation scheme; fault component degradation behavior; fault detection; fault diagnosis; fault initiating mode; hybrid differential evolution algorithm; mode dependent degradation behavior; model-based hybrid system prognosis; remaining useful life; user selected failure threshold; Circuit faults; Degradation; Mathematical model; Monitoring; Standards; Switches; Vectors; Degradation model; differential evolution (DE); dynamic fault isolation (DFI); failure threshold; hybrid systems; model-based prognosis; remaining useful life (RUL);
  • fLanguage
    English
  • Journal_Title
    Industrial Electronics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0046
  • Type

    jour

  • DOI
    10.1109/TIE.2013.2244538
  • Filename
    6425465