• DocumentCode
    3828808
  • Title

    Reply by Authors to Singh & Kankam

  • Author

    S.K. Banerjee;K. Rajamani

  • Author_Institution
    Department of Electrical Engineering//Indian Institute of Technology//Bombay, Powai 400 076 INDIA.
  • Issue
    5
  • fYear
    1976
  • Firstpage
    339
  • Lastpage
    339
  • Keywords
    Reliability
  • Journal_Title
    IEEE Transactions on Reliability
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/TR.1976.5220035
  • Filename
    5220035
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3828808