• DocumentCode
    382909
  • Title

    Combining ATPG and symbolic simulation for efficient validation of embedded array systems

  • Author

    Parthasarathy, Ganapathy ; Iyer, Madhu K. ; Feng, Tao ; Wang, Li.-C. ; Cheng, Kwang-Ting ; Abadir, Magdy S.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    203
  • Lastpage
    212
  • Abstract
    In the past, symbolic trajectory evaluation (STE) has been shown to be effective for verifying individual array blocks. However, when applying STE to verify multiple array blocks together as a single system, the run-time OBDD (ordered boolean decision diagrams) sizes would often blow up. In this paper, we propose the use of both an ATPG-based justification engine and symbolic simulation to facilitate the application of STE proof methodology for array systems. Our method translates a given verification problem instance into ATPG justification objectives, and partitions a given design into ATPG and symbolic simulation domains. Then, by developing a scheme that enables the ATPG justification engine to work closely with the symbolic simulator, the runtime OBDD sizes during each symbolic simulation run can be limited. We demonstrate the effectiveness of our approach by verifying the memory management units (MMU) in Motorola high-performance microprocessors. The verification of a MMU as a whole was not possible before because of the OBDD size blow-up problem when symbolic simulation is used in the STE proof process.
  • Keywords
    automatic test pattern generation; binary decision diagrams; circuit simulation; formal verification; integrated circuit design; integrated circuit modelling; integrated circuit testing; integrated memory circuits; logic arrays; logic partitioning; logic simulation; logic testing; microprocessor chips; storage management chips; symbol manipulation; ATPG justification objectives; ATPG-based justification engine; MMU; STE; STE proof methodology; array block verification; automatic test pattern generation; design partitioning; embedded array system validation; embedded memories; formal verification techniques; memory management units; microprocessors; ordered boolean decision diagrams; run-time OBDD sizes; symbolic simulation; symbolic trajectory evaluation; Application specific processors; Automatic test pattern generation; Circuit testing; Engines; Logic circuits; Logic design; Memory management; Microprocessors; Pipeline processing; Sequential analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2002. Proceedings. International
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-7542-4
  • Type

    conf

  • DOI
    10.1109/TEST.2002.1041762
  • Filename
    1041762