Title :
Realizing the benefits of structural test for Intel microprocessors
Author :
Mayberry, Mike ; Johnson, John ; Shahriari, Navid ; Tripp, Mike
Author_Institution :
Intel Corp., USA
Abstract :
This paper traces the evolution of the distributed test strategy at Intel, covering both the tester platform, which is now on the 2nd generation, as well as the parallel evolution of the test content, which is optimized for this platform. We describe the distribution of Pentium® 4 processor test content between structural and functional platforms, associated fallout, and key issues encountered with content migration. Finally, we discuss future test content and platform trends as shaped by increasing device complexity and defect types.
Keywords :
circuit complexity; fault location; integrated circuit testing; microprocessor chips; production testing; Intel microprocessors; Pentium4 processor; device complexity; device defect types; distributed test strategy; functional test platform; optimized test content; structural test; structural test platform; test content migration; test platform trends; tester platform; Automatic testing; Costs; Frequency; Memory architecture; Microprocessors; Pricing; System testing; Time measurement; Velocity measurement; Writing;
Conference_Titel :
Test Conference, 2002. Proceedings. International
Print_ISBN :
0-7803-7542-4
DOI :
10.1109/TEST.2002.1041795
