مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

3829290

Title :

Electronics Division

Issue :

fYear :

1982

Keywords :

"USA Councils","Quality control","Reliability engineering","Consumer electronics","Design engineering","Failure analysis","Product safety","Read-write memory","Risk analysis","Electronics industry"

Journal_Title :

IEEE Transactions on Reliability

Publisher :

ieee

ISSN :

0018-9529

Type :

jour

DOI :

10.1109/TR.1982.5221450

Filename :

5221450

Link To Document :

https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3829290