• DocumentCode
    3834
  • Title

    Simulation of Laterally Coupled InGaZnO4-Based Electric-Double-Layer Transistors for Synaptic Electronics

  • Author

    Xiang Wan ; Ping Feng ; Guo Dong Wu ; Yi Shi ; Qing Wan

  • Author_Institution
    Sch. of Electron. Sci. & Eng., Nanjing Univ., Nanjing, China
  • Volume
    36
  • Issue
    2
  • fYear
    2015
  • fDate
    Feb. 2015
  • Firstpage
    204
  • Lastpage
    206
  • Abstract
    Artificial synapse is the key element for neuromorphic systems. Recently, synaptic transistors have been proposed and investigated, but physical understanding of such synaptic devices based on ion/electron electrostatic coupling effect remains unknown. Here, laterally coupled InGaZnO4 electric-double-layer synaptic transistors were numerically simulated. An ion drift-diffusion model is employed to describe the laterally capacitive coupling of the proton conducting electrolyte. Important synaptic behaviors, such as excitatory postsynaptic current and paired-pulse facilitation, are mimicked by the transient solution. InGaZnO4 synaptic device exhibits an extremely low-power consumption of ~0.2 pJ/spike. Our simulation results are interesting for energy-efficient synaptic electronics and neuromorphic systems.
  • Keywords
    electrolytes; electrostatics; gallium compounds; indium compounds; neural chips; semiconductor device models; transistors; wide band gap semiconductors; zinc compounds; InGaZnO4; artificial synapse; energy-efficient synaptic electronics; excitatory postsynaptic current; ion drift-diffusion model; ion-electron electrostatic coupling effect; laterally capacitive coupling; laterally coupled-based electric-double-layer synaptic transistor simulation; low-power consumption; neuromorphic systems; paired-pulse facilitation; proton conducting electrolyte; synaptic electronics; Capacitance; Couplings; Logic gates; Neuromorphics; Numerical models; Protons; Transistors; Electric-double-layer; Ion drift-diffusion model; Laterally-coupled synaptic transistors; electric-double-layer; ion drift-diffusion model;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2015.2388952
  • Filename
    7001618