• DocumentCode
    383740
  • Title

    A B-s complement continuous valued digit adder

  • Author

    Aroca, Ricardo Andres ; Ahmadi, M. ; Hashemian, Reza ; Jullien, G.A. ; Miller, W.C.

  • Author_Institution
    VLSI Res. Group, Windsor Univ., Ont., Canada
  • Volume
    2
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    433
  • Abstract
    This paper presents the first VLSI implementation of test circuitry for the continuous valued digits number system (CVNS). The CVNS is a recently introduced number system that uses a set of analog digits; the lower-order digits being used only to correct inaccuracies in the higher order digits. In order to provide a vehicle for the test implementation, an 8 bit, radix 2, B-s complement CVNS adder is designed using current mode analog circuitry. This initial test circuit is purposely designed with very conservative performance parameters, solely with the aim of demonstrating the viability of the representation and associated arithmetic circuitry. The test structures includes an 8 bit D/A, a modulo operation circuit, and an analog correction circuit. These blocks are combined with two new circuits to realize a novel design approach to CVNS addition that guarantees more than sufficient precision in the generation of the least significant continuous valued digit (CVD), and high tolerance to implementation error.
  • Keywords
    VLSI; adders; analogue processing circuits; circuit simulation; current-mode circuits; digital arithmetic; digital-analogue conversion; hybrid computers; integrated circuit design; integrated circuit modelling; integrated circuit testing; logic design; logic testing; 8 bit; B-s complement continuous valued digit adders; CVD; CVNS addition precision; CVNS arithmetic; D/A; VLSI; analog correction circuits; analog digits; continuous valued digits number system; current mode analog circuitry; higher/lower-order digits; implementation error tolerance; least significant continuous valued digit; modulo operation circuits; Adders; Arithmetic; Circuit testing; Digital systems; Digital-analog conversion; Diodes; Laboratories; System testing; Vehicles; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics, Circuits and Systems, 2002. 9th International Conference on
  • Print_ISBN
    0-7803-7596-3
  • Type

    conf

  • DOI
    10.1109/ICECS.2002.1046187
  • Filename
    1046187