• DocumentCode
    384122
  • Title

    Adopting IVI: an incremental approach [Interchangeable Virtual Instruments]

  • Author

    Donnell, Steven J O´ ; Brackett, Robert A.

  • fYear
    2002
  • fDate
    2002
  • Firstpage
    324
  • Lastpage
    336
  • Abstract
    Interchangeable Virtual Instruments (IVI) instrument driver technology offers the test system developer many benefits over existing implementations. As instruments become obsolete, or as newer higher performance or lower cost instruments become available, the significant investment expended on the Test Program Set (TPS) will not be impacted. Lockheed Martin Information Systems (LMIS) is encouraged by the promise IVI brings to Automatic Test Equipment (ATE). We are committed to the principle of isolating test software from the variability of a specific instrument. We have demonstrated this commitment by incorporating an IVI-like interface in our automated test systems several years ago when IVI was not adequately defined. As a result, we have seen first-hand the benefits it brings to non-recurring engineering expenses of new systems. Today, IVI is still not fully defined; its major drawback being the limited number of approved instrument classes. The slow speed of bringing an instrument class to fruition may be the major obstacle of adopting IVI in a test system. This paper identifies our approach for an incremental adoption of IVI into current, future, and legacy programs as it becomes more defined.
  • Keywords
    automatic test equipment; field buses; virtual instrumentation; ATE; IVI instrument driver technology; IVI-like interface; automated test systems; automatic test equipment; interchangeable virtual instruments; signal driver; signal interface; test system developer; Automatic testing; Computer architecture; Hardware; Information systems; Instruments; RF signals; Radio frequency; Software testing; System software; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON Proceedings, 2002. IEEE
  • ISSN
    1080-7725
  • Print_ISBN
    0-7803-7441-X
  • Type

    conf

  • DOI
    10.1109/AUTEST.2002.1047902
  • Filename
    1047902