Three dimensional measurement using color structured patterns and imaging spectrograph

In this paper, we propose a simultaneous measurement system of spectral reflectance and shape of an object with the use of color gray code structured patterns and an imaging spectrograph. Color and shape information are very important for its to recognize objects. Therefore, we have proposed an earlier system which is able to measure spectral reflectance and shape simultaneously by the imaging spectrograph. This system uses the gray code patterns to measure the shape of target. However, the measurement time for whole target was long, because this system measures only 1 line at a time. Therefore, a more effective measuring method is needed. This paper describes a measuring method using color gray code structured patterns. This proposed method uses the spectral characteristics of the projector effectively.