• DocumentCode
    384388
  • Title

    Robust contrast-invariant eigen detection

  • Author

    Chennubhotla, Chakra ; Jepson, Allan ; Midgley, John

  • Author_Institution
    Dept. of Comput. Sci., Toronto Univ., Ont., Canada
  • Volume
    2
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    745
  • Abstract
    We achieve two goals in this paper: (1) to build a novel appearance-based object representation that takes into account variations in contrast often found in training images; (2) to develop a robust appearance-based detection scheme that can handle outliers such as occlusion and structured noise. To build the representation, we decompose the input ensemble into two subspaces: a principal subspace (within-subspace) and its orthogonal complement (out-of-subspace). Before computing the principal subspace, we remove any dependency on contrast that the training set might exhibit. To account for pixel outliers in test images, we model the residual signal in the out-of-subspace by a probabilistic mixture model of an inlier distribution and a uniform outlier distribution. The mixture model, in turn, facilitates the robust estimation of the within-subspace coefficients. We show our methodology leads to an effective classifier for separating images of eyes from non-eyes extracted from the FERET dataset.
  • Keywords
    Gaussian distribution; estimation theory; image coding; image representation; object detection; principal component analysis; FERET dataset; appearance-based object representation; eye database; inlier distribution; occlusion; orthogonal complement; out-of-subspace; outliers; pixel outliers; principal component analysis; principal subspace; probabilistic mixture model; residual signal modeling; robust appearance-based detection scheme; robust contrast-invariant eigen detection; robust estimation; structured noise; training images; uniform outlier distribution; unit-variance Gaussian distribution; within-subspace coefficients; Computer science; Educational institutions; Eyes; Image coding; Image databases; Image reconstruction; Pixel; Principal component analysis; Robustness; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pattern Recognition, 2002. Proceedings. 16th International Conference on
  • ISSN
    1051-4651
  • Print_ISBN
    0-7695-1695-X
  • Type

    conf

  • DOI
    10.1109/ICPR.2002.1048410
  • Filename
    1048410