Title :
Technology Variability From a Design Perspective
Author :
Borivoje Nikolic;Ji-Hoon Park;Jaehwa Kwak;Bastien Giraud;Zheng Guo;Liang-Teck Pang;Seng Oon Toh;Ruzica Jevtic;Kun Qian;Costas Spanos
Author_Institution :
Department of Electrical Engineering and computer Sciences, University of California, Berkeley, CA, USA
Abstract :
Increased variability in semiconductor process technology and devices requires added margins in the design to guarantee the desired yield. Variability is characterized with respect to the distribution of its components, its spatial and temporal characteristics and its impact on specific circuit topologies. Approaches to variability characterization and modeling for digital logic and SRAM are analyzed in this paper. Transistor arrays and ring oscillator arrays are designed to isolate specific systematic and random variability components in the design. Distributions of SRAM design margins are measured by using padded-out cells and observing minimum array operating voltages. Correlations between various components of variability are essential for adding appropriate margins to the design.
Keywords :
"Random access memory","Systematics","Logic gates","Transistors","Current measurement","Delay","Frequency measurement"
Journal_Title :
IEEE Transactions on Circuits and Systems I: Regular Papers
DOI :
10.1109/TCSI.2011.2165389