DocumentCode
386012
Title
Measurement of Non-Planar Dielectric Samples Using an Open Resonator
Author
Chan, W.F.P. ; Chambers, B.
Volume
1
fYear
1987
fDate
May 9 1975-June 11 1987
Firstpage
273
Lastpage
276
Abstract
A new technique for the measurement of the complex permittlvity of dielectric samples having convex-concave surfaces using an open resonator is reported. The paper discusses the theory behind the new technique and describes measurements made at 11.6 GHz on perspex samples whose surfaces have radii of curvature as small as 330mm. The results obtained are in good agreement with those for the same material measured in flat sheet form.
Keywords
Dielectric materials; Dielectric measurements; Electric variables measurement; Geometry; Mirrors; Permittivity measurement; Position measurement; Resonance; Resonant frequency; Surface waves;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 1987 IEEE MTT-S International
Conference_Location
Palo Alto, CA, USA
ISSN
0149-645X
Type
conf
DOI
10.1109/MWSYM.1987.1132382
Filename
1132382
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