Title :
Efficient self-recovering ASIC design
Author :
S.N. Hamilton;A. Orailoglu
Author_Institution :
California Univ., San Diego, La Jolla, CA, USA
Abstract :
The authors present a framework for tailoring fault-tolerant approaches for both permanent and transient faults to the specific needs of an application. These methodologies provide an efficient alternative to traditional triplication and rollback schemes and allow tailoring of area-resiliency trade-offs for individual designs.
Keywords :
"Application specific integrated circuits","Degradation","Fault tolerance","Fault diagnosis","Application software","Delay","Fault detection","Testing","Computer errors","High level synthesis"
Journal_Title :
IEEE Design & Test of Computers
