Title :
A comparison method for THz measurements using VNA and TDS
Author :
Mira Naftaly;Nick Ridler;John Molloy;Nosherwan Shoaib;Daniel Stokes
Author_Institution :
National Physical Laboratory, Teddington TW11 0LW, UK
Abstract :
A method is described for direct comparison of dielectric measurements obtained by a vector network analyzer and a time domain spectrometer. The method employs a material that can be inserted into a waveguide for VNA measurements or contained in a cell for TDS measurements.
Keywords :
"Permittivity measurement","Standards","Petroleum","Refractive index","Absorption","Permittivity"
Conference_Titel :
Infrared, Millimeter, and Terahertz waves (IRMMW-THz), 2015 40th International Conference on
Electronic_ISBN :
2162-2035
DOI :
10.1109/IRMMW-THz.2015.7327635
