Broadband Terahertz Analysis of Energetic Materials—Influence of Crystal Structure and Additives

Author

Huhn, Anna K. ; Saenz, Elena ; de Maagt, Peter ; Bolivar, P. Haring

Author_Institution

Inst. of High Freq. & Quantum Electron., Univ. of Siegen, Siegen, Germany

Volume

3

Issue

5

fYear

2013

fDate

Sept. 2013

Firstpage

649

Lastpage

655

Abstract

A detailed broadband analysis of energetic materials using THz time-domain spectroscopy with a bandwidth from 0.2 to 6.4 THz is presented. Dependencies of the resonance features on different sample parameters are evaluated via spectroscopic investigation of several energetic materials (TNT, C4, RDX, PETN, AN) in transmission and reflection experiments. A strong dependency of the resonance features on the manufacturing process of an explosive is observed especially with TNT. The THz measurements of the TNT samples are compared to powder X-ray diffraction measurements. Furthermore, it is observed that additive compounds with a flat frequency response offset the THz reflection of an explosive, but the recognition capability of a resonance feature is not influenced.

Keywords

X-ray diffraction; additives; chemical variables measurement; crystal structure; explosive detection; powders; spectrochemical analysis; terahertz spectroscopy; AN; C4; PETN; RDX; THz measurements; THz reflection; THz time-domain spectroscopy; TNT; additive compounds; broadband analysis; broadband terahertz analysis; crystal structure; energetic materials; explosive; flat frequency response; frequency 0.2 THz to 6.4 THz; manufacturing process; powder X-ray diffraction; recognition capability; reflection experiments; resonance features; spectroscopic investigation; transmission experiments; Broadband terahertz (THz) spectroscopy; energetic materials; security application; spectral fingerprints;

fLanguage

English

Journal_Title

Terahertz Science and Technology, IEEE Transactions on

Publisher

ieee

ISSN

2156-342X

Type

jour

DOI

10.1109/TTHZ.2013.2265602

Filename

6544644