DocumentCode
389167
Title
Failure of digital IC under the influence of electromagnetic radiation
Author
Vasiliev, K.B. ; Klyuchnik, A.V. ; Solodov, A.V.
Author_Institution
Radiotechnical Inst., Acad. of Sci., Moscow, Russia
fYear
2001
fDate
14-14 Sept. 2001
Firstpage
540
Lastpage
541
Abstract
The experimental data of digital IC failure under the influence of short pulse electromagnetic irradiation are presented. The energy of IC damage is determined as a function of electromagnetic pulse duration and repetition rate. Experiments have been performed in centimeter and millimeter wave band.
Keywords
digital integrated circuits; failure analysis; radiation effects; IC damage energy; centimeter wave band; digital IC failure; millimeter wave band; pulse duration; pulse repetition rate; short pulse electromagnetic irradiation;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave and Telecommunication Technology, 2001. CriMiCo 2001. 11th International Conference on
Conference_Location
Sevastopol, Crimea, Ukraine
Print_ISBN
966-7968-00-6
Type
conf
Filename
1173961
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