DocumentCode
389183
Title
Near-field microwave microscope for investigation of dielectrics
Author
Zagorodnii, V.V. ; Launets, V.L. ; Oliynyk, V.V.
Author_Institution
Fac. of Radiophys., Nat. Taras Shevchenko Univ. of Kyiv, Ukraine
fYear
2001
fDate
14-14 Sept. 2001
Firstpage
586
Lastpage
587
Abstract
Elaboration results for a near-field microwave microscope are presented. The main parameters of the microscope are given. The possibility of its application for investigation of heterogeneous dielectrics and nondestructive quality inspection in the microwave range is assessed. An open-ended coaxial waveguide is used as a probe.
Keywords
coaxial waveguides; dielectric measurement; inspection; microscopes; microwave measurement; nondestructive testing; probes; dielectrics; heterogeneous dielectrics; microscope parameters; microwave range; near-field microwave microscope; nondestructive quality inspection; open-ended coaxial waveguide probe;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave and Telecommunication Technology, 2001. CriMiCo 2001. 11th International Conference on
Conference_Location
Sevastopol, Crimea, Ukraine
Print_ISBN
966-7968-00-6
Type
conf
Filename
1173978
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