Error analysis and improvement of potential tracing algorithm for global illumination

Author

Zunce, Wei ; Jizhou, Sun

Author_Institution

Dept. of Comput. Sci., Tianjin Univ., China

Volume

1

fYear

2002

fDate

28-31 Oct. 2002

Firstpage

261

Abstract

Considering the variance bought up by approximation of radiance during the first pass, this paper presents error analysis and an improvement method for the potential tracing algorithm. With a general form of equations for importance sampling based random walks, variance analysis is given and its relationship to the error of radiance is shown. Aiming at error reduction, a computing method of alternatively solving both adjoint equations is proposed, giving a progressive refinement to both radiance and value of the required flux. Analysis of the method demonstrates a promising convergence rate with iterations.

Keywords

brightness; convergence of numerical methods; error analysis; image denoising; importance sampling; iterative methods; lighting; ray tracing; rendering (computer graphics); Monte Carlo method; convergence rate; error analysis; error reduction; global illumination; importance sampling; iterations; potential tracing algorithm; progressive refinement; radiance approximation; random walks; variance analysis; Analysis of variance; Approximation algorithms; Convergence; Error analysis; Integral equations; Lighting; Monte Carlo methods; Noise reduction; Sampling methods; Sun;

fLanguage

English

Publisher

ieee

Conference_Titel

TENCON '02. Proceedings. 2002 IEEE Region 10 Conference on Computers, Communications, Control and Power Engineering

Print_ISBN

0-7803-7490-8

Type

conf

DOI

10.1109/TENCON.2002.1181264

Filename

1181264