• DocumentCode
    390882
  • Title

    Failure analysis of IGCTs (5SHX 08F4502) in series connection in three level VSI

  • Author

    Qingguang, Yu ; Wenhua, Liu ; Qiang, Song

  • Author_Institution
    FACTS Inst., Tsinghua Univ., Beijing, China
  • Volume
    3
  • fYear
    2002
  • fDate
    28-31 Oct. 2002
  • Firstpage
    2091
  • Abstract
    IGCTs (integrated gate commutated thyristors) was developed by ABB to be widely used in high voltage converters. IGCT also has been adopted in series to get higher output voltage of the converters. In this paper, failure analysis of IGCTs in series connection in three level VSI (voltage source inverter) was put forward, we share our experience, and discuss how to make full use of IGCTs.
  • Keywords
    MOS-controlled thyristors; failure analysis; invertors; 4.5 kV; 5SHX 08F4502 IGCT; 630 A; ABB; IGCT; failure analysis; high voltage converters; integrated gate commutated thyristors; output voltage; series connection; three level VSI; voltage source inverter; Commutation; Failure analysis; Heat sinks; IEEE members; Medium voltage; Packaging; Pulse width modulation; Pulse width modulation inverters; Thyristors; Water heating;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    TENCON '02. Proceedings. 2002 IEEE Region 10 Conference on Computers, Communications, Control and Power Engineering
  • Print_ISBN
    0-7803-7490-8
  • Type

    conf

  • DOI
    10.1109/TENCON.2002.1182755
  • Filename
    1182755