• DocumentCode
    39132
  • Title

    Mass Measurement of 1-kg Silicon Spheres for Determination of the Avogadro and Planck Constants

  • Author

    Mizushima, Shigeki ; Kuramoto, Naoki ; Ueda, Kazunaga ; Fujii, Kenichi

  • Author_Institution
    Nat. Metrol. Inst., Japan & the Nat. Inst. of Adv. Ind. Sci. & Technol., Tsukuba, Japan
  • Volume
    64
  • Issue
    6
  • fYear
    2015
  • fDate
    Jun-15
  • Firstpage
    1527
  • Lastpage
    1532
  • Abstract
    For the accurate determination of the Avogadro and Planck constants by the X-ray crystal density method, the mass of 1-kg silicon spheres must be measured precisely. This paper describes the mass measurement method and the evaluation of its uncertainty at the National Metrology Institute of Japan (NMIJ). For the precise mass measurement, the amount of the physical adsorption of water vapor on the surface of the silicon spheres, which could be a relative amount of about 10-8 of the total mass, was evaluated by comparison weighings both in nitrogen gas and in water vapor at a pressure of about 1200 Pa. In addition, we compare the results of seven 1-kg mass measurements conducted at the NMIJ and the International Bureau of Weights and Measures from 1996 to 2011 to confirm the reliability of our mass measurement.
  • Keywords
    constants; elemental semiconductors; mass measurement; measurement uncertainty; silicon; Avogadro constant determination; International Bureau of Weights and Measures; NMIJ; National Metrology Institute of Japan; Planck constant determination; Si; X-ray crystal density method; mass 1 kg; mass measurement method; measurement uncertainty evaluation; reliability; silicon sphere; water vapor adsorption; Adsorption; Atmospheric measurements; Silicon; Standards; Steel; Uncertainty; Weight measurement; Avogadro´s constant; Avogadro???s constant; Planck´s constant; Planck???s constant; mass measurement; silicon sphere; silicon sphere.;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.2015.2389351
  • Filename
    7024156