DocumentCode
39132
Title
Mass Measurement of 1-kg Silicon Spheres for Determination of the Avogadro and Planck Constants
Author
Mizushima, Shigeki ; Kuramoto, Naoki ; Ueda, Kazunaga ; Fujii, Kenichi
Author_Institution
Nat. Metrol. Inst., Japan & the Nat. Inst. of Adv. Ind. Sci. & Technol., Tsukuba, Japan
Volume
64
Issue
6
fYear
2015
fDate
Jun-15
Firstpage
1527
Lastpage
1532
Abstract
For the accurate determination of the Avogadro and Planck constants by the X-ray crystal density method, the mass of 1-kg silicon spheres must be measured precisely. This paper describes the mass measurement method and the evaluation of its uncertainty at the National Metrology Institute of Japan (NMIJ). For the precise mass measurement, the amount of the physical adsorption of water vapor on the surface of the silicon spheres, which could be a relative amount of about 10-8 of the total mass, was evaluated by comparison weighings both in nitrogen gas and in water vapor at a pressure of about 1200 Pa. In addition, we compare the results of seven 1-kg mass measurements conducted at the NMIJ and the International Bureau of Weights and Measures from 1996 to 2011 to confirm the reliability of our mass measurement.
Keywords
constants; elemental semiconductors; mass measurement; measurement uncertainty; silicon; Avogadro constant determination; International Bureau of Weights and Measures; NMIJ; National Metrology Institute of Japan; Planck constant determination; Si; X-ray crystal density method; mass 1 kg; mass measurement method; measurement uncertainty evaluation; reliability; silicon sphere; water vapor adsorption; Adsorption; Atmospheric measurements; Silicon; Standards; Steel; Uncertainty; Weight measurement; Avogadro´s constant; Avogadro???s constant; Planck´s constant; Planck???s constant; mass measurement; silicon sphere; silicon sphere.;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/TIM.2015.2389351
Filename
7024156
Link To Document