Title :
Lead-free solder evaluation for ball attache process
Author :
Anand, Ashok ; Mui, Y.C.
Author_Institution :
Adv. Micro Devices, Singapore, Singapore
Abstract :
In recent years, increasing awareness of lead-free requirement in electronics industry is driving the need to investigate lead-free solder systems in detail. This paper investigates three types of solder alloys, Sn/3.8Ag/0.7Cu, Sn/3.5Ag and Sn/0.7Cu used in a ball attache process. The scope of this paper covers lead-free solder system, comprehensively from ball attache process to board assembly reliability. This includes study on intermetallics at substrate-ball interface, PCB-ball interface, solid state diffusion study, shear force trend, failure modes and thermal cycling study of solder joints when assembled with Ni/Au and OSP finished PCBs. It was observed that the low processing temperature of Sn/3.5Ag and Sn/3.8Ag/0.7Cu make them viable lead-free alloys to implement in assembly lines. The solder life performance of these alloys is better than Sn/37Pb alloy on Ni/Au PCB but does not fare well on OSP finished PCBs. On the other hand, Sn/0.7Cu solder has a process temperature that is ten degrees above Sn/3.5Ag and Sn/3.8Ag/0.7Cu but solder life performance on Ni/Au and OSP finished PCBs fares better than other lead-free and tin-lead alloys.
Keywords :
circuit reliability; failure analysis; microassembling; printed circuit manufacture; reflow soldering; OSP finished PCBs; PCB-ball interface; Sn/0.7Cu; Sn/3.5Ag; Sn/3.8Ag/0.7Cu; SnAg; SnAgCu; SnCu; assembly lines; ball attache process; board assembly reliability; electronics industry; failure modes; intermetallics; lead-free solder evaluation; process temperature; processing temperature; shear force trend; solder life performance; solid state diffusion study; substrate-ball interface; thermal cycling study; Assembly systems; Electronics industry; Environmentally friendly manufacturing techniques; Gold alloys; Intermetallic; Lead; Nickel alloys; Temperature; Thermal force; Tin;
Conference_Titel :
Electronics Packaging Technology Conference, 2002. 4th
Print_ISBN :
0-7803-7435-5
DOI :
10.1109/EPTC.2002.1185588