Nonlinear analysis of CMOS LC-tuned VCO phase noise

Author

Magierowski, Sebastian K. ; Zukotynski, Stefan

Author_Institution

Dept. of Electr. & Comput. Eng., Toronto Univ., Ont., Canada

Volume

1

fYear

2002

fDate

4-7 Aug. 2002

Abstract

A second order nonlinear stochastic differential equation is used as a tool for phase noise analysis in submicron CMOS LC VCOs. The negative resistance topology typical of integrated microwave designs is considered. Expressions for the phase noise characteristics are derived in terms of circuit parameters and shown to closely match simulation results. The insight gained is used to explore circuit design trade-offs.

Keywords

CMOS analogue integrated circuits; circuit tuning; integrated circuit noise; negative resistance circuits; nonlinear network analysis; phase noise; radiofrequency integrated circuits; radiofrequency oscillators; voltage-controlled oscillators; CMOS LC-tuned VCO; RFIC; circuit parameters; integrated microwave design; negative resistance topology; phase noise; second-order nonlinear stochastic differential equation; Circuit noise; Circuit simulation; Circuit topology; Differential equations; Phase noise; Radio frequency; Semiconductor device modeling; Signal design; Stochastic resonance; Voltage-controlled oscillators;

fLanguage

English

Publisher

ieee

Conference_Titel

Circuits and Systems, 2002. MWSCAS-2002. The 2002 45th Midwest Symposium on

Print_ISBN

0-7803-7523-8

Type

conf

DOI

10.1109/MWSCAS.2002.1187139

Filename

1187139