• DocumentCode
    39250
  • Title

    A New Method for Obtaining Stress-Depth Calibration Profiles for Non-Destructive Evaluation Using a Frequency-Dependent Model of Barkhausen Emissions

  • Author

    Kypris, Orfeas ; Nlebedim, Ikenna Cajetan ; Jiles, David C.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Iowa State Univ., Ames, IA, USA
  • Volume
    49
  • Issue
    7
  • fYear
    2013
  • fDate
    Jul-13
  • Firstpage
    3893
  • Lastpage
    3896
  • Abstract
    This study presents the development of a non-destructive method of detecting stress as a function of depth, useful for inspecting steel structures and components without the need to calibrate against x-ray diffraction data. A new frequency-dependent model for Barkhausen emissions based on the attenuation of emission with frequency and distance is used to extract depth-dependent stress information. Controlled, uniform stresses are induced in an ASTM A36 steel specimen, which are then used as a reference to obtain stress-voltage calibration profiles. An inversion process can then be employed to assess specimens of unknown stress states, by using the previously calculated profiles. The slope of the calibration profiles is found to vary with depth, and a simple computer algorithm may be used to extract stresses at different depths by using an averaging method.
  • Keywords
    Barkhausen effect; X-ray diffraction; calibration; inspection; nondestructive testing; steel; stress analysis; structural engineering; ASTM A36 steel specimen; Barkhausen emission; X-ray diffraction data; averaging method; computer algorithm; depth-dependent stress information extraction; frequency-dependent model; inversion process; nondestructive evaluation; slope; steel structure inspection; stress detection; stress-depth calibration profile; stress-voltage calibration profiles; Calibration; Magnetic hysteresis; Magnetomechanical effects; Noise; Steel; Stress; Voltage measurement; Barkhausen effect; magnetic Barkhausen noise; non-destructive evaluation; non-destructive testing; stress depth profiling;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2013.2251328
  • Filename
    6559017