DocumentCode
392574
Title
3D profile measurement by color pattern projection and system calibration
Author
Sinlapeecheewa, C. ; Takamasu, K.
Author_Institution
Dept. of Precision Eng., Univ. of Tokyo, Japan
Volume
1
fYear
2002
fDate
2002
Firstpage
405
Abstract
In this paper, we present a new color structured lighting for 3D profile measurement by projecting a pattern of color stripes. The advantage of using color pattern is that it simplifies the difficult matching problem of using a multiple-line stripe pattern. The problem of finding the correct color stripe correspondence between a light source and images is solved by accurately calibrating the system parameters. A technique for camera-projector calibration using the calibration points that projected from a projector is presented. The mean error of this calibration method is about 0.2 mm. A pattern of color stripes is projected onto the objects when taking images with cameras from various viewpoints, and the stripe pattern information are extracted from the acquired images and then used for finding the correct projected-observed stripe match. After the matched stripes information was obtained, a 3D profile is then reconstructed by means of triangulation. The selection of color used to generate the color-stripe pattern is presented. An experiment using human hand as a model is also demonstrated.
Keywords
calibration; computer vision; computerised instrumentation; image colour analysis; measurement systems; pattern matching; 3D profile measurement; color pattern projection; multiple-line stripe pattern; pattern matching; projector-cameras calibration; structured light; triangulation; Calibration; Cameras; Color; Geometrical optics; Humans; Image reconstruction; Light sources; Optical sensors; Pattern matching; Stereo vision;
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial Technology, 2002. IEEE ICIT '02. 2002 IEEE International Conference on
Print_ISBN
0-7803-7657-9
Type
conf
DOI
10.1109/ICIT.2002.1189930
Filename
1189930
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