• DocumentCode
    392624
  • Title

    Laser-fired contacts - transfer of a simple high efficiency process scheme to industrial production

  • Author

    Preu, R. ; Schneiderlochner, E. ; Grohe, A. ; Glunz, S.W. ; Willeke, G.

  • Author_Institution
    Fraunhofer-Inst. fur Solare Energiesysteme, Freiburg, Germany
  • fYear
    2002
  • fDate
    19-24 May 2002
  • Firstpage
    130
  • Lastpage
    133
  • Abstract
    Laser-fired Contacts (LFC) have just recently been proposed as a simple way to realize local contacting for a passivated rear surface. Efficiencies above 20% have been reported for this technology. This work aims to assess the current status of the transfer of this process scheme to industrial production. The application of laser-fired contacts to 2 Ω€cm silicon wafers yielding an open circuit voltage of more than 660 mV clearly indicates the formation of a local aluminum back surface field. A newly developed pilot type laser system with automated wafer handling is presented. Due to the use of scanning mirrors for the movement of the laser beam the LFC process time is reduced to just a few seconds per wafer. Finally the most important criteria for an industrial transfer are discussed in comparison to the standard Aluminum back surface field (Al-BSF), being the benchmark for any other rear surface passivation scheme up to now.
  • Keywords
    aluminium; elemental semiconductors; laser materials processing; passivation; silicon; solar cells; 20 percent; 660 mV; LFC; Si-Al; high efficiency process scheme; industrial production; laser-fired contacts; local contacting; passivated rear surface; scanning mirrors; silicon wafers; surface passivation; Aluminum; Circuits; Laser applications; Laser beams; Metals industry; Mirrors; Production; Silicon; Surface emitting lasers; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 2002. Conference Record of the Twenty-Ninth IEEE
  • ISSN
    1060-8371
  • Print_ISBN
    0-7803-7471-1
  • Type

    conf

  • DOI
    10.1109/PVSC.2002.1190473
  • Filename
    1190473