• DocumentCode
    392627
  • Title

    Thermo-catalytic deposition of silicon nitride - a new method for excellent silicon surface passivation

  • Author

    Moschner, Jens D. ; Schmidt, Jan ; Hezel, Rudolf

  • Author_Institution
    Inst. fur Solarenergieforschung Hameln/Emmerthal (ISFH), Emmerthal, Germany
  • fYear
    2002
  • fDate
    19-24 May 2002
  • Firstpage
    174
  • Lastpage
    177
  • Abstract
    The deposition of silicon nitride (SiN) films for the surface passivation of crystalline silicon solar cells by thermo-catalytic chemical vapor deposition (cat-CVD), also known as hot-wire CVD, was investigated. A detailed study was performed to assess the useful parameter range. We found that with this new technique very high gas yield and deposition rate can be reached using a very simple deposition source. Excellent surface passivation of p-type silicon could be achieved for the first time using SiN films deposited by cat-CVD. A very strong correlation of the film composition and surface recombination with the gas flow ratio was observed. The films have been applied to the front and back of solar cells to demonstrate their effectiveness. A detailed comparison between cat-CVD and high-quality plasma-deposited films has been performed, in which the films prove very similar.
  • Keywords
    catalysts; elemental semiconductors; passivation; plasma CVD coatings; silicon; silicon compounds; solar cells; surface recombination; Si; Si-SiN; cat-CVD; crystalline silicon solar cells; film composition; hot-wire CVD; plasma-deposited films; silicon surface passivation; surface recombination; thermo-catalytic chemical vapor deposition; Coatings; Crystallization; Gases; Hydrogen; Passivation; Photovoltaic cells; Semiconductor films; Silicon compounds; Temperature; Vacuum systems;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 2002. Conference Record of the Twenty-Ninth IEEE
  • ISSN
    1060-8371
  • Print_ISBN
    0-7803-7471-1
  • Type

    conf

  • DOI
    10.1109/PVSC.2002.1190484
  • Filename
    1190484