DocumentCode
393723
Title
Dead time measurement of closed loop system by wavelet
Author
Tabaru, Tetsuya ; Shin, Seiichi
Author_Institution
Univ. of Tokyo, Japan
Volume
4
fYear
2002
fDate
5-7 Aug. 2002
Firstpage
2483
Abstract
This paper shows that the wavelet based dead time measurement method, which has been already studied for open loop systems. is also applicable to closed loop systems. The method uses a wavelet transform of a cross correlation function between an input and an output. To achieve our objective, we derive the wavelet transform for the. closed loop case.
Keywords
closed loop systems; correlation methods; delays; wavelet transforms; closed loop systems; cross correlation function; wavelet based dead time measurement; wavelet transform; Closed loop systems; Delay effects; Fourier transforms; Linear systems; Open loop systems; Propagation delay; Time measurement; Wavelet analysis; Wavelet transforms; White noise;
fLanguage
English
Publisher
ieee
Conference_Titel
SICE 2002. Proceedings of the 41st SICE Annual Conference
Print_ISBN
0-7803-7631-5
Type
conf
DOI
10.1109/SICE.2002.1195804
Filename
1195804
Link To Document