• DocumentCode
    393723
  • Title

    Dead time measurement of closed loop system by wavelet

  • Author

    Tabaru, Tetsuya ; Shin, Seiichi

  • Author_Institution
    Univ. of Tokyo, Japan
  • Volume
    4
  • fYear
    2002
  • fDate
    5-7 Aug. 2002
  • Firstpage
    2483
  • Abstract
    This paper shows that the wavelet based dead time measurement method, which has been already studied for open loop systems. is also applicable to closed loop systems. The method uses a wavelet transform of a cross correlation function between an input and an output. To achieve our objective, we derive the wavelet transform for the. closed loop case.
  • Keywords
    closed loop systems; correlation methods; delays; wavelet transforms; closed loop systems; cross correlation function; wavelet based dead time measurement; wavelet transform; Closed loop systems; Delay effects; Fourier transforms; Linear systems; Open loop systems; Propagation delay; Time measurement; Wavelet analysis; Wavelet transforms; White noise;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    SICE 2002. Proceedings of the 41st SICE Annual Conference
  • Print_ISBN
    0-7803-7631-5
  • Type

    conf

  • DOI
    10.1109/SICE.2002.1195804
  • Filename
    1195804