DocumentCode
394103
Title
ESD challenges in magnetic recording: past, present and future
Author
Wallash, Al
Author_Institution
Maxtor Corp., Milpitas, CA, USA
fYear
2003
fDate
30 March-4 April 2003
Firstpage
222
Lastpage
228
Abstract
The past, present and future ESD challenges in magnetic recording are reviewed. ESD damage mechanisms for the recording head are explained. It is shown that in the past 11 years, the ESD failure voltage for the recording head has decreased dramatically from its initial value of 15,000 VHBM to only 15 VHBM today. ESD control principles that focus on metal contact removal are discussed. It is concluded that ESD will continue to play an increasingly important role in the design, manufacture and handling of magnetic recording devices.
Keywords
electric breakdown; electrostatic discharge; failure analysis; giant magnetoresistance; hard discs; magnetic heads; magnetic recording; magnetoresistive devices; AMR; ESD challenges; ESD control principles; ESD damage mechanisms; ESD failure voltage; GMR; TMR; electrical breakdown; hard disk drive; magnetic recording; metal contact removal; modified Paschen curve; recording head; Anisotropic magnetoresistance; Electric breakdown; Electrostatic discharge; Giant magnetoresistance; Hard disks; Magnetic heads; Magnetic recording; Manufacturing; Transducers; Transistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium Proceedings, 2003. 41st Annual. 2003 IEEE International
Print_ISBN
0-7803-7649-8
Type
conf
DOI
10.1109/RELPHY.2003.1197749
Filename
1197749
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