• DocumentCode
    394103
  • Title

    ESD challenges in magnetic recording: past, present and future

  • Author

    Wallash, Al

  • Author_Institution
    Maxtor Corp., Milpitas, CA, USA
  • fYear
    2003
  • fDate
    30 March-4 April 2003
  • Firstpage
    222
  • Lastpage
    228
  • Abstract
    The past, present and future ESD challenges in magnetic recording are reviewed. ESD damage mechanisms for the recording head are explained. It is shown that in the past 11 years, the ESD failure voltage for the recording head has decreased dramatically from its initial value of 15,000 VHBM to only 15 VHBM today. ESD control principles that focus on metal contact removal are discussed. It is concluded that ESD will continue to play an increasingly important role in the design, manufacture and handling of magnetic recording devices.
  • Keywords
    electric breakdown; electrostatic discharge; failure analysis; giant magnetoresistance; hard discs; magnetic heads; magnetic recording; magnetoresistive devices; AMR; ESD challenges; ESD control principles; ESD damage mechanisms; ESD failure voltage; GMR; TMR; electrical breakdown; hard disk drive; magnetic recording; metal contact removal; modified Paschen curve; recording head; Anisotropic magnetoresistance; Electric breakdown; Electrostatic discharge; Giant magnetoresistance; Hard disks; Magnetic heads; Magnetic recording; Manufacturing; Transducers; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability Physics Symposium Proceedings, 2003. 41st Annual. 2003 IEEE International
  • Print_ISBN
    0-7803-7649-8
  • Type

    conf

  • DOI
    10.1109/RELPHY.2003.1197749
  • Filename
    1197749