• DocumentCode
    39420
  • Title

    Algorithms for 3D Shape Scanning with a Depth Camera

  • Author

    Yan Cui ; Schuon, Sebastian ; Thrun, Sebastian ; Stricker, Didier ; Theobalt, Christian

  • Author_Institution
    Augmented Vision, German Res. Center for Artificial Intell., Kaiserslautern, Germany
  • Volume
    35
  • Issue
    5
  • fYear
    2013
  • fDate
    May-13
  • Firstpage
    1039
  • Lastpage
    1050
  • Abstract
    We describe a method for 3D object scanning by aligning depth scans that were taken from around an object with a Time-of-Flight (ToF) camera. These ToF cameras can measure depth scans at video rate. Due to comparably simple technology, they bear potential for economical production in big volumes. Our easy-to-use, cost-effective scanning solution, which is based on such a sensor, could make 3D scanning technology more accessible to everyday users. The algorithmic challenge we face is that the sensor´s level of random noise is substantial and there is a nontrivial systematic bias. In this paper, we show the surprising result that 3D scans of reasonable quality can also be obtained with a sensor of such low data quality. Established filtering and scan alignment techniques from the literature fail to achieve this goal. In contrast, our algorithm is based on a new combination of a 3D superresolution method with a probabilistic scan alignment approach that explicitly takes into account the sensor´s noise characteristics.
  • Keywords
    filtering theory; image resolution; probability; random noise; sensor fusion; solid modelling; video cameras; video signal processing; 3D object scanning; 3D scanning technology; 3D shape scanning; 3D superresolution method; ToF camera; data quality; depth camera; depth scans; economical production; established filtering techniques; nontrivial systematic bias; probabilistic scan alignment; random noise; scan alignment techniques; scanning solution; sensor noise characteristics; time-of-flight camera; video rate; Cameras; Image reconstruction; Image resolution; Noise; Shape; Solid modeling; Systematics; 3D scanning; Kinect; Superresolution; global alignment; nonrigid transformation; rigid transformation; time-of-flight;
  • fLanguage
    English
  • Journal_Title
    Pattern Analysis and Machine Intelligence, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0162-8828
  • Type

    jour

  • DOI
    10.1109/TPAMI.2012.190
  • Filename
    6296662