Analysis of transmit diversity schemes: impact of fade distribution, spatial correlation and channel estimation errors

Author

Vanganuru, Kiran ; Annamalai, A.

Author_Institution

Bradley Dept. of Electr. & Comput. Eng., Virginia Tech, Blacksburg, VA, USA

Volume

1

fYear

2003

fDate

20-20 March 2003

Firstpage

247

Abstract

In this paper, we analyze the average symbol error rate performance of arbitrary two dimensional signal constellations in conjunction with both open-loop and close-loop transmit diversity schemes in a generalized fading environment (including Rayleigh, Nakagami-m, Rician and mixed multipath fading environments). The mathematical framework can treat the case of non-identical fading parameters and dissimilar mean signal strengths across the diversity paths. We also present an analysis of the impact of spatial correlation on the performance of various transmit diversity schemes over Nakagami multipath fading channels. The impact of imperfect channel estimates (Gaussian errors) on various transmit diversity schemes in Rayleigh fading environment is also studied via analytical as well as simulation techniques.

Keywords

Rayleigh channels; channel estimation; correlation methods; diversity reception; error statistics; multipath channels; Gaussian errors; Nakagami-m fading environments; Rayleigh fading environments; average symbol error rate performance; channel estimation errors; close-loop transmit diversity schemes; dissimilar mean signal strengths; diversity paths; fade distribution; fading environment; mathematical framework; mixed multipath fading environments; nonidentical fading parameters; open-loop transmit diversity schemes; spatial correlation; transmit diversity scheme analysis; two dimensional signal constellations; Block codes; Channel estimation; Computer errors; Constellation diagram; Error analysis; Fading; Performance analysis; Rayleigh channels; Signal analysis; Transmitting antennas;

fLanguage

English

Publisher

ieee

Conference_Titel

Wireless Communications and Networking, 2003. WCNC 2003. 2003 IEEE

Conference_Location

New Orleans, LA, USA

ISSN

1525-3511

Print_ISBN

0-7803-7700-1

Type

conf

DOI

10.1109/WCNC.2003.1200354

Filename

1200354