DocumentCode :
39551
Title :
Analysis of Safety-Critical Computer Failures in Medical Devices
Author :
Alemzadeh, Homa ; Iyer, Ravishankar K. ; Kalbarczyk, Zbigniew ; Raman, Jaishankar
Author_Institution :
Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
Volume :
11
Issue :
4
fYear :
2013
fDate :
July-Aug. 2013
Firstpage :
14
Lastpage :
26
Abstract :
Malfunctioning medical devices are one of the leading causes of serious injury and death in the US. Between 2006 and 2011, 5,294 recalls and approximately 1.2 million adverse events were reported to the US Food and Drug Administration (FDA). Almost 23 percent of these recalls were due to computer-related failures, of which approximately 94 percent presented medium to high risk of severe health consequences (such as serious injury or death) to patients. This article investigates the causes of failures in computer-based medical devices and their impact on patients by analyzing human-written descriptions of recalls and adverse event reports obtained from public FDA databases. The authors characterize computer-related failures by deriving fault classes, failure modes, recovery actions, and number of devices affected by the recalls. This analysis is used as a basis for identifying safety issues in life-critical medical devices and providing insights on the future challenges in the design of safety-critical medical devices.
Keywords :
biomedical equipment; computerised instrumentation; failure analysis; injuries; medical administrative data processing; US; US Food and Drug Administration; adverse event reports; computer-based medical device failure analysis; failure mode; fault class; human-written description analysis; life-critical medical devices; malfunctioning medical devices; recalled devices; recalls; recovery action; safety issues; safety-critical computer failure analysis; safety-critical device design; serious injury; Accidents; Analytical models; Biomedical equipment; Computers; Failure analysis; Government agencies; Injuries; Medical devices; Safety; Security; FDA; FDA adverse events; FDA recalls; Food and Drug Administration; MAUDE database; failure analysis; medical devices; safety;
fLanguage :
English
Journal_Title :
Security & Privacy, IEEE
Publisher :
ieee
ISSN :
1540-7993
Type :
jour
DOI :
10.1109/MSP.2013.49
Filename :
6509886
Link To Document :
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