Title :
High-performance carrier interferometry OFDM WLANs: RF testing
Author :
Wiegandt, D.A. ; Wu, Z. ; Nassar, C.R.
Author_Institution :
Dept. of ECE, Colorado State Univ., Fort Collins, CO, USA
Abstract :
In the author´s earlier work, we demonstrated how performance degradation and PAPR concerns in OFDM can be overcome by application of carrier interferometry (CI) spreading codes. In this work, the authors employ RF test equipment and analyze the practical performance of OFDM (orthogonal frequency division multiplexing) based IEEE 802.11a WLAN vs. their proposed carrier interferometry (CI) OFDM based WLAN. Specifically, RF test results (in a typical indoor office environment) are used to analyze the proposed CI/OFDM and CI/COFDM technologies. It is shown that in a typical office environment, at a bit error rate of 10-3, the CI technology gains 5-7 dB over current OFDM.
Keywords :
OFDM modulation; codes; error statistics; indoor radio; spread spectrum communication; wireless LAN; COFDM; OFDM; RF testing; WLANs; bit error rate; carrier interferometry; indoor office environment; orthogonal frequency division multiplexing; spreading codes; wireless local area networks; Bit error rate; Degradation; Interferometry; OFDM; Peak to average power ratio; Performance analysis; Radio frequency; Test equipment; Testing; Wireless LAN;
Conference_Titel :
Communications, 2003. ICC '03. IEEE International Conference on
Print_ISBN :
0-7803-7802-4
DOI :
10.1109/ICC.2003.1204170