DocumentCode
3958
Title
Circuit Analysis of Photosensitive Capacitance in Semi-Insulating GaAs
Author
Boulais, Kevin A. ; Santiago, Fabian ; Wick, Peter L. ; Mejeur, J.M. ; Rayms-Keller, A. ; Lowry, Michael S. ; Long, Karen J. ; Sessions, Walter D.
Author_Institution
Dahlgren Div., Naval Surface Warfare Center, Dahlgren, VA, USA
Volume
60
Issue
2
fYear
2013
fDate
Feb. 2013
Firstpage
793
Lastpage
798
Abstract
We describe a circuit model for photosensitive capacitance in bulk semi-insulating GaAs toward tunable resonant applications. Capacitances from two separate regions are considered to interpret experimental results. A smaller valued capacitance exists between the depletion edges within the bulk material. Photodoping in this region progressively shorts out the bulk capacitance, leaving only the higher valued depletion capacitance. The depletion capacitance also increases with illumination, and numerical simulation is used to aid interpretation. Thus, the series combination of capacitance can be optically varied over orders of magnitude. Our results indicate that capacitance is nearly independent of applied voltage over a usable parameter space, making the concept attractive for linear application.
Keywords
III-V semiconductors; capacitors; gallium arsenide; network analysis; GaAs; bulk capacitance; bulk material; bulk semiinsulating gallium arsenide; circuit analysis; circuit model; depletion capacitance; depletion edges; illumination; linear application; numerical simulation; photodoping; photosensitive capacitance; tunable resonant applications; Capacitance; Charge carrier processes; Density measurement; Gallium arsenide; Optical saturation; Optical sensors; Photonics; Capacitance; EL2; photosensitive; reactance; undoped semi-insulating GaAs (USI);
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2012.2235070
Filename
6407990
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