Title :
Methodology for RF receiver sensitivity analysis using electromagnetic field map
Author :
Kim, Jonghoon J. ; Yang, K.M. ; Kim, Jae Min ; Kim, Yong Jun ; Lee, S.Y.
Author_Institution :
Digital Media & Commun. R&D Center, Samsung Electron. Co., Suwon, South Korea
Abstract :
Accurate modelling of a chip is a very important factor when analysing and predicting radio-frequency (RF) receiver sensitivity. Chip modelling based on the tangential electromagnetic (EM) field from the near-field measurement just above the top surface of the chip is introduced, and a methodology utilising three-dimensional (3D) EM simulation, for predicting receiver sensitivity generated by the chip-noise of a mobile phone, is suggested. It is worth noting here that the calculation of absolute coupling values between a noise source and an antenna is possible by using the real measured data source to obtain reliable results.
Keywords :
antennas; circuit simulation; electromagnetic fields; integrated circuit modelling; integrated circuit noise; radio receivers; radiofrequency integrated circuits; sensitivity analysis; smart phones; 3D EM simulation; RF receiver sensitivity analysis; antenna; chip modelling; chip noise; mobile phone; near field measurement; noise source; tangential electromagnetic field;
Journal_Title :
Electronics Letters
DOI :
10.1049/el.2014.1355