DocumentCode
396391
Title
Inflection point correction for voltage references
Author
Tiew, Kee-Chee ; Cusey, Jim ; Geiger, Randall
Author_Institution
Dept. of Electr. & Comput. Eng., Iowa State Univ., Ames, IA, USA
Volume
1
fYear
2003
fDate
25-28 May 2003
Abstract
A self-calibration technique that corrects the inflection point of the reference voltage curvature is presented. This technique employs lattice-heating effect of semiconductor to change the operating temperature of the circuit. By sampling the reference voltage at two temperatures, the inflection point of the reference voltage curvature is first estimated and then corrected if necessary. The implementation was verified through simulation, and the results are attractive for achieving optimal first-order voltage references.
Keywords
calibration; reference circuits; inflection point correction; lattice-heating effect; operating temperature; optimal first-order voltage references; self-calibration technique; Circuit simulation; Heating; Lattices; Ovens; Photonic band gap; Sampling methods; Switches; Temperature dependence; Temperature sensors; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 2003. ISCAS '03. Proceedings of the 2003 International Symposium on
Print_ISBN
0-7803-7761-3
Type
conf
DOI
10.1109/ISCAS.2003.1205647
Filename
1205647
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