• DocumentCode
    396391
  • Title

    Inflection point correction for voltage references

  • Author

    Tiew, Kee-Chee ; Cusey, Jim ; Geiger, Randall

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Iowa State Univ., Ames, IA, USA
  • Volume
    1
  • fYear
    2003
  • fDate
    25-28 May 2003
  • Abstract
    A self-calibration technique that corrects the inflection point of the reference voltage curvature is presented. This technique employs lattice-heating effect of semiconductor to change the operating temperature of the circuit. By sampling the reference voltage at two temperatures, the inflection point of the reference voltage curvature is first estimated and then corrected if necessary. The implementation was verified through simulation, and the results are attractive for achieving optimal first-order voltage references.
  • Keywords
    calibration; reference circuits; inflection point correction; lattice-heating effect; operating temperature; optimal first-order voltage references; self-calibration technique; Circuit simulation; Heating; Lattices; Ovens; Photonic band gap; Sampling methods; Switches; Temperature dependence; Temperature sensors; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2003. ISCAS '03. Proceedings of the 2003 International Symposium on
  • Print_ISBN
    0-7803-7761-3
  • Type

    conf

  • DOI
    10.1109/ISCAS.2003.1205647
  • Filename
    1205647