DocumentCode :
396391
Title :
Inflection point correction for voltage references
Author :
Tiew, Kee-Chee ; Cusey, Jim ; Geiger, Randall
Author_Institution :
Dept. of Electr. & Comput. Eng., Iowa State Univ., Ames, IA, USA
Volume :
1
fYear :
2003
fDate :
25-28 May 2003
Abstract :
A self-calibration technique that corrects the inflection point of the reference voltage curvature is presented. This technique employs lattice-heating effect of semiconductor to change the operating temperature of the circuit. By sampling the reference voltage at two temperatures, the inflection point of the reference voltage curvature is first estimated and then corrected if necessary. The implementation was verified through simulation, and the results are attractive for achieving optimal first-order voltage references.
Keywords :
calibration; reference circuits; inflection point correction; lattice-heating effect; operating temperature; optimal first-order voltage references; self-calibration technique; Circuit simulation; Heating; Lattices; Ovens; Photonic band gap; Sampling methods; Switches; Temperature dependence; Temperature sensors; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 2003. ISCAS '03. Proceedings of the 2003 International Symposium on
Print_ISBN :
0-7803-7761-3
Type :
conf
DOI :
10.1109/ISCAS.2003.1205647
Filename :
1205647
Link To Document :
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