• DocumentCode
    3992
  • Title

    Accurate Power Circuit Loss Estimation Method for Power Converters With Si-IGBT and SiC-Diode Hybrid Pair

  • Author

    Takao, Kazuto ; Ohashi, H.

  • Author_Institution
    Electron Devices Lab., Toshiba Corp., Kawasaki, Japan
  • Volume
    60
  • Issue
    2
  • fYear
    2013
  • fDate
    Feb. 2013
  • Firstpage
    606
  • Lastpage
    612
  • Abstract
    An accurate power circuit loss estimation method has been developed for designing power converters with hybrid pairs of silicon (Si) insulated-gate bipolar transistor (Si-IGBT) and silicon carbide (SiC) Schottky barrier diode/SiC p-i-n diode. An analytical model of the switching losses of the hybrid pairs is proposed to achieve high accuracy and short calculation time. The nonlinearity of the device parameters and the stray inductance in the circuit are considered in the model. For the accurate power loss calculation, an empirical parameter extraction method is introduced for extracting device parameters. The calculated circuit power losses are compared with measurement results, and good agreements are confirmed. By using the proposed method, the power loss of a power converter utilizing 4.5-kV Si-IGBT/SiC-p-i-n-diode hybrid pairs is estimated to investigate the upper limitation of the switching frequency.
  • Keywords
    Schottky diodes; elemental semiconductors; insulated gate bipolar transistors; p-i-n diodes; power convertors; power semiconductor diodes; semiconductor device models; silicon; silicon compounds; Schottky barrier diode; SiC; device parameter nonlinearity; empirical parameter extraction method; insulated gate bipolar transistor; p-i-n diode; power circuit loss estimation method; power converters; silicon-IGBT-silicon carbide-diode hybrid pair; stray inductance; switching frequency; switching loss analytical model; voltage 4.5 kV; Analytical models; Estimation; Integrated circuit modeling; Logic gates; P-i-n diodes; Silicon carbide; Switches; Insulated-gate bipolar transistors (IGBTs); Schottky barrier diode; p-i-n diode; power loss;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2012.2226179
  • Filename
    6407994